Digital Logic Testing and Simulation
| dc.contributor.editor | Miczo, Alexander | |
| dc.date.accessioned | 2019-07-30T05:50:39Z | |
| dc.date.accessioned | 2024-04-26T12:48:52Z | |
| dc.date.available | 2019-07-30T05:50:39Z | |
| dc.date.available | 2024-04-26T12:48:52Z | |
| dc.date.issued | 2003 | |
| dc.identifier.isbn | 0-471-43995-9 | |
| dc.identifier.uri | https://drs.ess.gov.et/handle/12345678/77190 | |
| dc.language.iso | en | en_US |
| dc.publisher | John Wiley & Sons, Inc | en_US |
| dc.subject | Digital electronics—Testing | en_US |
| dc.title | Digital Logic Testing and Simulation | en_US |
| dc.type | Book | en_US |