Bias Temperature Instability for Devices and Circuits
| dc.contributor.author | Grasser, Tibor | |
| dc.date.accessioned | 2019-08-21T09:18:13Z | |
| dc.date.accessioned | 2024-04-22T11:23:15Z | |
| dc.date.available | 2019-08-21T09:18:13Z | |
| dc.date.available | 2024-04-22T11:23:15Z | |
| dc.date.issued | 2014 | |
| dc.identifier.isbn | 978-1-4614-7909-3 | |
| dc.identifier.uri | https://drs.ess.gov.et/handle/12345678/79199 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer Science | en_US |
| dc.subject | Temperature | en_US |
| dc.title | Bias Temperature Instability for Devices and Circuits | en_US |
| dc.type | Book | en_US |